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document number: mc146010 rev. 1.0, 5/2007 freescale semiconductor technical data ? freescale semiconductor, in c., 2007. all rights reserved. low power cmos photoelectric smoke detector ic the mc146010 is an advanced smoke detector component containing sophisticated very-low power analog and digital circuitry. the ic, when used with an infrared photoelectric chamber and a sm all number of external components, will detect smoke by sensing scattere d light from smoke particles. when detection occurs, a pulsating alarm is sounded via on-chip push-pull drivers and an external piezoelectric transducer. the mc146010 provides both audible a nd visual alarms. upon sensing a normal smoke level, both alarms will be activated. it is possible to mute the audible alarm for approximately eight minutes through the integrated mute function (imf), although the led will continue to flash at a high rate. this feature is resettable through a pushbutton test. the imf feature will be overridden by remote smoke, high smoke level, timeout or reset. the alarm memory feature will allow for identification of an alarming detector. through a pushbutton test, the led will fl ash rapidly if there was a previous alarm condition detected at the unit. the variable-gain photo amplifier allows direct interface to ir detector (photodiode). the gain settings are determined by external capacitors and compensation resistors. a two stage speed-up is incorporated into the smoke monitor to minimize time and help reduce false triggering. further reduction of false triggering is also addressed with the double sample chamber sensitivity and double i/o sample. features ? integrated mute function (imf) to temporarily disable horn ? alarm memory to help identify alarming unit ? speed-up sampling rate after first detection of smoke ? double sample for degraded chamber sensitivity monitor ? digital noise filter on the i/o pin ? power-up and power-down reset ? low-battery trip point set externally ? temporal horn pattern ? operating temperature: -10 to 75c ? operating voltage range: 6.0 to 12 v ? average supply current: 6.5 a ordering information device temp. range package mc146010ed -10 to 75c plastic dip mcz146010eg/r2 soic package mc146010 low power cmos photoelectric smoke detector ic 16 1 ed suffix plastic dip 98asb42431b 16 eg suffix soic package 98asb42567b 1
sensors 2 freescale semiconductor mc146010 figure 1. block diagram figure 2. pin assignment (16-pin dip) detect osc r1 test strobe low-supply trip 3 12 13 16 4 15 1 2 c1 c2 amp zero gain osc timing logic v dd - 3.5 v v dd - 4.0 v ref comp - + gate on/off gate on/off - + comp v dd - 5.0 v ref smoke low supply alarm, mute, & reset logic horn modulator and driver i/o brass silver feedback ired led pin 5 = v dd pin 14 = v ss 7 8 9 10 6 11 c1 c2 detect strobe v dd ired i/o brass test/mute low-supply v ss r1 osc led feedback silver trip 16 15 14 13 12 11 10 9 1 2 3 4 5 6 7 8
sensors freescale semiconductor 3 mc146010 this device contains protection circuitry to guard against damage due to high static voltages or electric fields. however, precautions must be taken to avoid applications of voltages any higher than maximum rated voltages to this high-impedance circuit. for proper operation, v in and v out should be constrained to a range of v ss (v in or v out ) v dd except for i/o pin which can exceed v dd , and the test/mute input, which can go below v ss . unused inputs must always be tied to an appropriate logic voltage level (e.g. either v ss or v dd ). unused outputs and/or an unused i/o must be left open. table 1. maximum ratings (1) (voltages referenced to v ss ) 1. maximum ratings are those values beyond which damage to the device may occur. func tional operation should be restricted to th e limits in the electrical char acteristics tables. symbol parameter value unit v dd dc supply voltage -0.5 to +12 v v in dc input voltage c1, c2, detect osc, low-supply trip i/o feedback test -0.25 to v dd +0.25 -0.25 to v dd +0.25 -0.25 to v dd +10 -15 to +25 -1.0 to v dd +0.25 v i in dc input current, per pin 10 ma i out dc output current, per pin 25 ma i dd dc supply current, v dd /v ss pins (15 seconds in reverse dir.) +25 forward -150 reverse ma p d power dissipation ? in stil air, 5 sec. ?? continuous 1200 (2) 350 (3) 2. derating: -12 mw/c from 25c to 60c. 3. derating: -3.5 mw/c from 25c to 60c. mw t stg storage temperature -55 to +125 c t a operating temperature -25 to +75 c t l lead temperature, 1 mm from case for 10 seconds 260 c table 2. electrical characteristics (voltages referenced to v ss , t a = -10 to 60 c unless otherwise indicated.) symbol parameter test condition test pin v dd min max unit v dd power supply voltage range ? ? 6.0 12 v v th supply threshold voltage, low supply alarm low supply trip: v in = v dd /3 15 ? 7.2 7.8 v i dd average operating supply current (per package) (does not include current through d3-ir emitter) standby configured per figure 5 ? ? 12 9.0 ? ? 9.0 7.0 a i dd peak supply current (per package) (does not include ired current into base of q1) during strobe on, ired off configured per figure 5 during strobe on, ired on configured per figure 5 ? ? 12 12 ? ? 1.25 2.5 ma v il low level input voltage i/o feedback test 7.0 10 16 9.0 9.0 9.0 ? ? ? 1.5 2.7 0.5 v v im mid level input voltage test 16 9.0 2.0 v dd -2.0 v v ih high level input voltage i/o feedback test 7.0 10 16 9.0 9.0 9.0 3.2 6.3 8.5 ? ? ? v i in input current osc, detect low-supply trip feedback test v in = v ss or v dd v in = v ss or v dd v in = v ss or v dd v in = v ss or v dd 3.12 15 10 16 12 12 12 12 -100 -100 -100 -100 +100 +100 +100 +100 na i il test mode input current v in = v ss or v dd 16 12 -100 -1.0 a
sensors 4 freescale semiconductor mc146010 * t a = 25 c only symbol parameter test condition test pin v dd min max unit i ih pull-down current test i/o v in = v dd i/o v in = v dd i/o v in = 17 v 16 7.0 12 9.0 9.0 12 ? 0.5 25 ? -1.0 1.0 100 140 a a v ol low-level output voltage led silver, brass i out = 10 ma i out = 16 ma 11 8.9 6.5 6.5 ? ? 0.6 1.0 v v oh high-level output voltage silver, brass i out = -16 ma 8.9 6.5 5.5 ? v v out output voltage strobe (for line regulation, see pin descriptions) inactive, i out = 1.0 a active, i out = 100 to 500 a (load regulation) 4.0 9.0 ? 9.0 v dd -0.1 v dd -5.4 ? v dd -4.6 v i oh high-level output current i/o local smoke, v out = 4.5 v local smoke, v out = v ss (short circuit current) 7.0 ? 6.5 12 -4.0 ? ? -16 ma i oz off-state output leakage current led v out = v ss or v dd 11 12 ? 100 na v ol active 1.0 ma ? 6.5 ? 0.5 v v ic common mode c1, c2, detect voltage range local smoke, pushbutton, or chamber sensitivity test ??v dd -4.0 v dd -2.0 v v ref smoke comparator internal reference voltage local smoke, pushbutton, or chamber sensitivity test ??v dd -3.9 v dd -3.1 v v ref-hi high smoke comparator internal reference voltage local smoke, pushbutton, or chamber sensitivity test ??v ref - 0.52 v ref -0.48 v table 2. electrical characteristics (voltages referenced to v ss , t a = -10 to 60 c unless otherwise indicated.) (continued) table 3 . ac electrical characteristics (refer to timing diagram figure 3 and figure 4 . t a = 25c, v dd = 9.0 v, component values from figure 5 .) no. symbol parameter test condition clocks min (1) typ (2) max (1) unit 11/f osc oscillator period free-running saw tooth measured at pin 12 1.0 9.5 10.5 11.5 ms 2t led led pulse period no local smoke, and no remote smoke 4096 38.9 43 47.1 s 3 remote smoke, but no local smoke ?? ? ? 4 local smoke 64 0.6 0.67 0.74 5 pushbutton test 64 0.6 0.67 0.74 ? pushbutton test with alarm memory 4.0 38 42 46 ms 6t w(led) , t w(stb) led pulse width and strobe pulse width remote smoke but no local smoke 1.0 9.5 10.5 11.5 ms 7t ired ired pulse period smoke test 1024 9.67 10.8 11.83 s 8 chamber sensitivity test, without local smoke 4096 38.9 43 47.1 9 local smoke, in speed-up 128 1.2 1.3 1.5 pushbutton test 128 1.2 1.3 1.5 10 t w(ired) ired pulse width t f *94 ? 116 s 11 t mod silver and brass modulation period local or remote smoke 32 304 336 368 ms 12 t on /t mod silver and brass duty cycle local or remote smoke ?73 75 77 %
sensors freescale semiconductor 5 mc146010 no. symbol parameter test condition clocks min (1) typ (2) max (1) unit 13 t ch silver and brass chirp pulse period low supply or degraded chamber sensitivity 4096 38.9 43 47.1 s 14 t w(ch) silver and brass chirp pulse width low supply or degraded chamber sensitivity 1.0 9.5 10.5 11.5 ms 15 t rr rising edge on io to smoke alarm response time remote smoke, no local smoke ??2sec (3) ? 16 t stb strobe out pulse period smoke test 1024 9.67 10.8 11.83 s 17 chamber sensitivity test without local smoke 4096 38.9 43 47.1 s 18 low supply test without local smoke 4096 38.9 43 47.1 s 19 pushbutton test/speed-up 128 1.2 1.3 1.5 s 20 t mute mute time local smoke ? 7.0 10 14 min 1. oscillator period t (t = t r + t f ) is determined by the external components r 1 , r 2 and c 3 where t r = (0.6931)r 2 *c 3 and t f = (0.6931)r 1 *c 3 . the other timing characteristics are some multiple of the oscill ator timing shown in the table. the timing shown should accommo date the nfpa72, ansi s3.41, and iso8201 audible emergency ev acuation signals. 2. typicals are not guaranteed. 3. time is typical-depends on what point in cycle the signal is applied. table 3 . ac electrical characteristics (refer to timing diagram figure 3 and figure 4 . t a = 25c, v dd = 9.0 v, component values from figure 5 .) (continued)
sensors 6 freescale semiconductor mc146010 figure 3. typical standby timing diagram mc146010 device 1 osc (pin 12) low supply test (internal) chamber test (internal) smoke test (internal) ired (pin 6) strobe (pin 4) led (pin 11) silver, brass enable (internal) power-on reset no low supply chamber sensitivity ok chirps indicate low supply chirps indicate degraded chamber sensitivity notes: numbers refer to the ac electrical characteristics table illustration is not to scale. 16 6 6 7 9 17 2 5 18 14 13 13
sensors freescale semiconductor 7 mc146010 figure 4. typical local sm oke timing mc146010 device ired strobe_ena led horn io smoke hi_smoke chmfault lb1 hush test_in ch1 600u 650u 700u 750u time (seconds)
sensors 8 freescale semiconductor mc146010 figure 5. typical battery powered application # values for r4, r5 and c6 may differ depending on type of horn used. * c2 and r13 are used for coarse sensitivit y adjustment. typical values are shown. ? r9 is for fine sensitivity adjustment (opt ional). if fixed resistors are used, r8 = 12k, r10 is 5.6k to 10k and r9 is eliminated . ** components necessary to utilize imf feature. r8 8.2 k ? r9 5.0 k ? r10 4.7 k ? r12 1.0 k ? ir current 4.7 to 22 ? c5 100 f c1 c2 r15 r14 1 m ? r11 d2 ir detector ir emitter d3 q1 to other mc146010(s) escape light(s) auxiliary alarm(s) remote(s) and/or dialer c4 22 f + 9.0 v b1 d1 reverse polarity protect. circuit sw1 sw2 silence feature (option) silence button pushbutton test r16 = 3.0 m ? r6 100 k ? r7 47 k ? r1 = 100 k ? c3 = 1500 pf r2 = 10 m ? c6 0.01 f r4 = 2.2 m ? r3 = 470 ? d4 visible led horn x1 r5 = 100 k ? c1 c2 detect strobe v dd ired i/o brass test & silence lowbatt v ss r1 osc led feedback silver mc146010
sensors freescale semiconductor 9 mc146010 pin descriptions c1 (pin 1) a capacitor connected to this pin as shown in figure 5 determines the gain of the on-chip photo amplifier during pushbutton test and chamber sens itivity test (high gain). the capacitor value is chosen such that the alarm tripped from background reflections in the chamber during pushbutton test. av = 1+(c1/10) where c1 is in pf. caution: the value of the closed-loop gain should not exceed 10,000. resistor r15 should be installed in series with c1 for lower gains. r15 =[1/(12 c1]-680 where r15 is in ohms and c1 is in farads. c2 (pin 2) a capacitor connected to this pin as shown in figure 5 determines the gain of the on-chip photo amplifier during pushbutton test and chamber sensitivity tests. av = 1+(c2/10) where c1 is in pf. this gain increases about 10% during ired pulse, after two consecutive local smoke detections. for proper compensation, resist or r14 must be installed in series with c2. r14 =[1/(12 c2]-680 where r14 is in ohms and c1 is in farads. detect (pin 3) this input to the high-gain pulse amplifier is tied to the cathode of an external photodiode. the photodiode should have low capacitance and low dark leakage current. the diode must be shunted by a lo ad resistor and is operated at zero bias. the detect input must be ac/dc decoupled from all other signals, v dd and v ss . lead length and/or foil traces to this pin must be minimized also. see figure 3 . the device has a sampling speed-up mode after the first smoke sample is detected. the speed-up frequency is one smoke sample about every 2 seconds for the duration of a smoke condition. it will take no-smoke samples to return to a standby mode. once out of a smoke condition, the ic will continue to sample for smoke about every 8 seconds. strobe (pin 4) this output provides the strobed, regulated voltage referenced to v dd . the temperature coefficient of this voltage is 0.2%/c maximum from -10 to 60c. the supply-voltage coefficient (line regulation) is 0.2%/v maximum from 6.0 to 12 v. strobe is tied to external resistor string r8, r9 and r10. v dd (pin 5) this pin is connected to the positive supply potential and may range from +6.0 to +12 v with respect to v ss . caution: in battery-powered applications, reverse- polarity protection must be provided exter- nally. ired (pin 6) this output provides pulsed base current for external npn transistor q1 used as the infrared emitter driver. q1 must have a 100. at 10 ma, the temper ature coefficient of the output voltage is typically +0.5%/c from -10 to 60c. the supply-voltage coefficient (line regulation) is 0.2%/v maximum from 6.0 to 12 v. the ired pulse width (active- high) is determined by external components r1 and c3. with a 100 k ? /1500 pf combination, the nominal width is 105 s. to minimize noise impact, ired is active near the end of strobe pulses for smoke tests, chamber sensitivity test, and pushbutton test. for the above mentioned width, ired will be active for the last 105 s of strobe pulse. i/o (pin 7) this pin can be used to connect up to 40 units together in a wired-or configuration for common signaling. v ss is used as the return. an on-chip current sink minimizes noise pickup during non-smoke conditions a nd eliminates the need for an external pull-down resistor to complete the wired-or. remote units at lower supply voltages do not draw excessive current from a sending unit at higher supply voltage. i/o can also be used to activate escape lights, auxiliary alarms, remote alarms and/or auto-dialers. as an input, this pin feeds a positive-edge-triggered flip- flop whose output is sampled nominally every 1 second during standby (using typical component values). once the first i/o remote smoke sample is detected, a second sample approximately 10 ms later will happen to confirm a remote smoke condition. if both samples are found to be high, the unit will start sounding an alarm. i/o is disabled by the on-chip power-on reset to eliminate nuisance signaling during battery changes or system power- up. if unused, i/o must be left unconnected. brass (pin 8) this half of the push-pull driv er output is connected to the metal support electrode of the piezoelectric audio transducer and to the horn-starting resistor. a continuous modulated tone from the transducer is a smoke alarm indicating either local or remote smoke. a short beep or chirp is a trouble alarm indicating a low supply or degraded chamber sensitivity. a series of short beeps or chirps during a pushbutton test indicate a previous alarm for detected smoke (alarm memory feature). silver (pin 9) this half of the push-pull driv er output is connected to the ceramic electrode of a piezoele ctric transducer and to the horn-starting capacitor. feedback (pin 10) this input is connected to both the feedback electrode of a self-resonating piezoelectric transducer and the horn- starting resistor and capacitor through current limiting resistor r4. if unused, the pin must be tied to v ss or v dd . led (pin11) this active-low open drain output directly drives an external visible led at the pulse rate indicated below. the pulse width is equal to the osc period.
sensors 10 freescale semiconductor mc146010 the load for the low-supply test is non-coincident with the smoke tests, chamber sensitivit y test, pushbutton test, or any alarm signals. the led also provides a visual indication of the detector status as follows, assuming the component values shown in figure 4 : standby (includes low-supply and chamber sensitivity tests) ? pulses every 32.4 seconds. local smoke ? pulses ever y 2.0 seconds (typical) mute ? pulses every 2.0 seconds (typical) remote smoke ? no pulses pushbutton test ? pulses every 2.0 seconds osc (pin 12) this pin is used in conjunctio n with external resistor r2 (7.5 m ? ) to v dd and external capacitor c3 (1500 pf) to v dd to form an oscillator with a nominal period of 7.9 msec (typical). r1 (pin 13) this pin is use din conjunction with resistor r1(100 k ? ) to pin 12 and c3 (1500 pf, see pin 12 description) to determine the ired pulse width. with this rc combination, the nominal pulse width is 105 s. v ss (pin 14) this pin is the negative supply potential and the return for the i/o pin. pin 14 is usually tied to ground. low-supply trip (pin 15) this pin is connected to an external voltage which determines the low-supply alarm threshold. the trip voltage is obtained through a resistor divider connected between the v dd and led pins. the low-supply alarm threshold voltage (in volts) = (5r7/r6)+5 where r6 and r7 are in the same units. test/mute (pin 16) this input has an on-chip pull-down device and is used to manually invoke a test mode, a mute mode, or a calibration mode. the pushbutton test mode is initiated by a high level at pin 16 (usually a depression of a s.p.s.t. normally-open pushbutton switch to v dd ). after one osc illator cycle, the ired pulses approximately ev ery 1.0 second, regardless of the presence of smoke. additionally, the amplifier gain is increased by automatic sele ction of c1. therefore the background reflections in the smoke chamber may be interpreted as smoke, generating a simulated smoke condition. after the second ir ed pulse, a successful test activates the horn-driver and i/o circuits. the active i/o allows remote signaling for a system testing. when the pushbutton test switch is rel eased, the test input returns to v ss due to the on-chip pull-down device. after one oscillator cycle, the amplifier gain return s to normal, th ereby removing the simulated smoke condition. after two additional ired pulses, less than three seconds, the ic exits the alarm mode and returns to standby timing. the pushbutton test will also activate the alarm memory feature. if there was a previous alarm detected by the unit, the horn will chirp every ? second as long as the test button is pressed. upon releasing of the test button , alarm memory will be reset. subsequent pressing of the test button will result in a pushbutton test f or simulated smoke. pressing the test button while in the mute mode will result in resetting of mute (and additionally a normal pushbutton test). the mute mode (imf) is initiated by a mid level voltage (around ? v dd ) at pin 16. a parallel mute button to an existing test button needs to be installed at the test pin. a smoke condition must be pres ent for the mute mode to be activated. if a no smoke condition gets detected while in the mute mode, the imf 8 minute window gets reset. the unit will return to standby mode. once in the mute mode, the audible smoke alarm (horn) is temporarily disabled for approximately 8 minutes while smoke condition is being detect ed. a visual smoke alarm will remain (led flashing) during mute mode. a high smoke voltage reference will also be activated at this time. simultaneous smoke and high smoke sampling will allow the unit to enable the horn driver in case a high smoke condition occurs during mute where the high smoke threshold is crossed. the mute mode can be overridden by the following conditions: 1) a no smoke condition is detected, 2) high smoke level detected, 3) remo te smoke detected through i/o, 4) reset through test button, 5) timeout of 8 minute window. to help prevent a jammed mute button condition, the divider string on the mute button should include a resistor to v dd , r15 (around 10 m ? ) and a resistor r16 (4.7 m ? ) and capacitor, c7 (0.047 mf) in series to v ss . calibration to facilitate checking the sensitivity and calibrating smoke detectors, the mc146010 can be placed in calibration mode. in this mode, certain device pins are controlled/reconfigured as shown in ta b l e 4 . to place the part in calibration mode, pin 16 (test/ mute) must be pulled below v ss pin with 100 a continuously drawn out of the pin for at least one cycle of the osc pin. to exit this mode, the test/ mute pin is floated for at least one osc cycle. in the calibration mode, the ir ed pulse rate is increased. an ired pulse occurs every cl ock cycle. also, strobe is always active low. it is recommended to short r12 ( figure 5 ) in this mode. this will allow for a similar recovery of the emitter circuitry as in normal operation. pin 1, pin 2, and pin 12 should be buffered with a unity gain amplifier to measure their outputs.
sensors freescale semiconductor 11 mc146010 table 4. mc146010 test mode logic table pin function type logic description pin 16, test test mode 1 trigger input none set a ?ve voltage to the pin and source 100 a from the pin to start test mode 1. pin 12, osc cap clock input input 0 internal clock low 1 internal clock high pin 5, v dd chip power pin 14, v ss chip ground pin 11, led built-in-test for hush timer output output pulse active low for 8 clocks every 128 clocks. pin 4, strobe analog ground output output low when pin 12 is low. pin 6, ired ired output 0 output low when pin 12 is low. 1 output high (3.0 v) when pin 12 is high. pin 3, detect smoke sensing input input no smk: v dd -2.5 v ? (1/hi gain) smk: v dd -2.5 v ?(1/low gain) hi smk: v dd -2.5 v ? (2/low gain) pin 8, brass smoke latch indicator output 0 output low when smoke latch not set. 1 output high when smoke latch set. pin 9, silver photo-comparator indicator output 0 output low when photo comparator not set. 1 output high when photo comparator set. pin 7, i/o photo-amp routing enable input 0 disable the function of pin 1, 2, 10 and 15 in test mode 1. 1 enable photoamplifier output routed to the pins and enable pins 1, 2, 10 and 15 in test mode 1. pin 15, low_batt low battery trip point input control photo amp. gain and output routing pin 10, feedback feedback input control hysteresis
sensors 12 freescale semiconductor mc146010 figure 6. recommended pcb layout
sensors freescale semiconductor 13 mc146010 package dimensions 98asb42431b issue t plastic dip page 1 of 3
sensors 14 freescale semiconductor mc146010 package dimensions 98asb42431b issue t plastic dip page 2 of 3
sensors freescale semiconductor 15 mc146010 package dimensions 98asb42431b issue t plastic dip page 3 of 3
sensors 16 freescale semiconductor mc146010 package dimensions 98asb42567b issue f soic package page 1 of 2
sensors freescale semiconductor 17 mc146010 package dimensions 98asb42567b issue f soic package page 2 of 2
how to reach us: home page: www.freescale.com e-mail: support@freescale.com usa/europe or locations not listed: freescale semiconductor technical information center, ch370 1300 n. alma school road chandler, arizona 85224 +1-800-521-6274 or +1-480-768-2130 support@freescale.com europe, middle east, and africa: freescale halbleiter deutschland gmbh technical information center schatzbogen 7 81829 muenchen, germany +44 1296 380 456 (english) +46 8 52200080 (english) +49 89 92103 559 (german) +33 1 69 35 48 48 (french) support@freescale.com japan: freescale semiconductor japan ltd. headquarters arco tower 15f 1-8-1, shimo-meguro, meguro-ku, tokyo 153-0064 japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com asia/pacific: freescale semiconductor hong kong ltd. technical information center 2 dai king street tai po industrial estate tai po, n.t., hong kong +800 2666 8080 support.asia@freescale.com for literature requests only: freescale semiconductor lite rature distribution center p.o. box 5405 denver, colorado 80217 1-800-441-2447 or 303-675-2140 fax: 303-675-2150 ldcforfreescalesemiconductor@hibbertgroup.com mc146010 rev. 1.0 5/2007 information in this document is provided solely to enable system and software implementers to use freescale semiconduc tor products. there are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. freescale semiconductor reserves the right to make changes without further notice to any products herein. freescale semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does freescale semiconductor assume any liability ar ising out of the application or use of any product or circuit, and specifically discl aims any and all liability, including without limitation consequential or incidental damages. ?typical? parameters that may be provided in freescale semiconductor data s heets and/or specifications can and do vary in different applications and actual performance may vary over time. all operating parameters, including ?typicals?, must be validated for each customer application by customer?s technical experts. freescale se miconductor does not convey any license under its patent rights nor the rights of others. freescale semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the fa ilure of the freescale semiconductor product could create a situation where personal injury or death may occur. should buyer purchase or use freescale semiconductor products for any such unintended or unauthorized application, buyer shall indemni fy and hold freescale semiconductor and its officers, employees, subsidiaries, affili ates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that freescale semiconductor was negligent regarding the design or manufacture of the part. freescale? and the freescale logo are trademarks of freescale semiconductor, inc. all other product or service names are the property of their respective owners. ? freescale semiconductor, inc., 2007. all rights reserved.

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